Noncontact Optical-Based Metrology for Microlens Characterization
Wed, Oct 5, 2022 1:00 PM - 2:00 PM EDT
Since micro-roughness and geometry directly impact the performance of the microlenses found in a wide variety of consumer devices and industrial sensors, precision metrology control is critical for lens development, process optimization, and mass production. Roger Posusta of Bruker Nano Inc. discusses how Bruker’s industry-leading white light interferometry (WLI) optical profilometers combine automation and on-the-fly analysis to enable truly comprehensive, high-throughput metrology and analysis for the development and production of even the most complex microlenses. Presented by Bruker.
Ultrafast and Photon-Number-Resolving Superconducting Nanowire Detectors
Thu, Oct 6, 2022 10:00 AM - 11:00 AM EDT
The highest development of photonic quantum instrumentation lies in the technology of superconducting nanowire single-photon detectors (SNSPDs). Félix Bussières, Ph.D., of ID Quantique, explores recent advances in the technology of SNSPDs and the quantum applications they empower. Standard SNSPD designs can only detect the presence or absence of photons, and their speed is limited by their intrinsic recovery times. With innovations found in ID Quantique’s commercially available ID281 Superconducting Nanowire Series, SNSPD users can count single photons more precisely and efficiently with precise photon-number resolution and with detection rates exceeding a billion counts per second. Bussières presents exciting new developments on how technology is progressing closer to scalable quantum computing and simulation and a realizable quantum internet. Presented by ID Quantique.
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