Measuring Long-Wavelength Lasers with IR Cameras, Pyroelectric Scanning-Slit Sensors, and Wavelength Conversion Apparatus
Tue, Jun 7, 2022 1:00 PM - 2:00 PM EDT
Numerous products and techniques have been developed to enable measurement of the beam quality parameters for long wavelength light sources. Kevin Kirkham, senior manager of new business development for Ophir at MKS Instruments, presents on the types of measurement tools available for long wavelength sources and helps determine which tools are appropriate for different applications. While there are many considerations that can significantly impact the laser process, an understanding of performance qualities can ensure users see successful outcomes. Presented by Ophir.
Laser Measurement Solutions for Materials Microprocessing Applications
Wed, Jun 15, 2022 11:00 AM - 12:00 PM EDT
Mark Slutzki, a product manager at Ophir, shares innovative solutions for the challenges that accompany materials microprocessing applications. Those who use lasers in these applications, such as drilling via holes in PCBs, organic LED display lift-off, and cutting smartphone cover glass, are faced with many challenges. While the combination of laser parameters enables new and innovative processes, they can also cause unexpected damage to the measurement tools used to keep the process stable. These parameters include ultra-short pulse duration, high repetition rates, short wavelengths, and many others.
Sponsored by Ophir, LaserPoint srl, and DataRay Inc.
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