Optical-Based Surface Metrology for CMP Optimization and Die Flatness Control
Tue, Nov 17, 2020 11:00 AM - 12:00 PM EST
This webinar with Samuel Lesko, Ph.D., highlights the use of optical profilers (based on white light interferometry, WLI) to assess die flatness on semiconductor wafers, as well as to optimize the chemical mechanical polishing (CMP) process. Lesko will discuss unique combination of nanometer accuracy and micron lateral resolution to automatically identify hot spots, unwanted erosion, or dishing along the die map and reference position on wafers. Presented by Bruker.
Line-Field Confocal Optical Coherence Tomography (LC-OCT): A New Tool for Noninvasive Cellular-Resolution Imaging of Human Skin
Wed, Nov 18, 2020 10:00 AM - 11:00 AM EST
This webinar with Jonas Ogien, Ph.D., of DAMAE Medical in France, will present a technique for high-resolution OCT, referred to as LC-OCT, which allows in particular to obtain vertical section images of in vivo human skin at cellular resolution and in real-time, revealing morphological features comparable to the ones that can be observed in histology images.
Applications for Video and High-Resolution Hyperspectral Imaging
Thu, Nov 19, 2020 1:00 PM - 2:00 PM EST
In this webinar with Paul Danini and Wouter Charle of imec, you will learn how the unique capabilities of hyperspectral imaging are applied to innovate businesses, applications, and research. The webinar will also elaborate on imec’s unique on-chip technology and off-the-shelf camera systems, as well as advanced imaging software and the comprehensive support tools that imec can provide. Presented by imec.
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