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Excelitas PCO GmbH - PCO.Edge 11-24 BIO LB
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Reminder: Join us for a FREE webinar: "Profiling Tightly Focused Beams in 2D Using Camera-Based Beam Profilers and Magnification Optics" (12/5/2023)

Reminder: Join us for a FREE webinar: "Profiling Tightly Focused Beams in 2D Using Camera-Based Beam Profilers and Magnification Optics"
Beam profilers are critical tools for characterizing lasers and light sources, whether the goal is to gain fundamental knowledge during research and development, to set important design parameters dur
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Tuesday, December 5, 2023
WEBINARS

Join us for a FREE Webinar

Profiling Tightly Focused Beams in 2D Using Camera-Based Beam Profilers and Magnification Optics

Tuesday, December 12, 2023 1:00 PM - 2:00 PM EST

 Register Now 
Presented by

 

 
In this webinar, Logan Hatanaka of DataRay discusses camera-based options for capturing true 2D beam profiles of tightly focused beam waists by using magnification optics, like those included in DataRay’s Industrial Laser Monitoring System (ILMS). By carefully magnifying a beam waist onto a camera sensor, engineers can produce detailed profiles in true 2D, an excellent option for characterizing small beam waists, regardless of beam shape. The goal is to produce an optical system which does not affect the original beam profile; therefore, choosing appropriate optics for a magnification system is critical. Hatanaka addresses important lens parameters and shows how these parameters affect measured beam profiles using real-world data. With a properly designed magnification system, profiling small, complex beam waists is easy and repeatable. Presented by DataRay Inc.
 

 

Upcoming Webinars

- Custom Optics Unleashed: Rapid Prototyping and Engineering, 12/7/2023 1:00:00 PM EST

Archived Webinars

- Optimization of Surface Enhanced Spatially Offset Raman Spectroscopy for Applications in Pre-Clinical Cancer Imaging
- Next-Generation Instrumentation for Optical Control and Characterization
- Mastering Diffraction Gratings: Selection and Integration Techniques for Analytical Instrumentation

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