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Tuesday, December 5, 2023 |
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Presented by
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This webinar provides an overview of advanced measurement technologies tailored to meet the high-resolution demands of silicon photonics and planar waveguide applications. Lawrence Rooney of Bruker shares about state-of-the-art film thickness and refractive index measurement techniques, including multi-angle spectroscopic reflectometry and ellipsometry, and discusses their respective advantages, limitations, and suitability for different types of multi-layer photonic structures. He also highlights the critical importance of high-resolution film thickness and refractive index measurement techniques in the advancement of silicon photonics and planar waveguide applications. Presented by Bruker.
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