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Wednesday, January 11, 2023 |
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Interferometry is a powerful tool when used to characterize optical surface form errors, as well as accumulated errors, when measuring transmitted wavefronts. Opticians and engineers have many methods available to facilitate such measurements but can often overlook the effects caused by part holding or fixturing. These effects can have a significant impact on both the efficiency of making measurements and the reliability of the results.
The key considerations when characterizing individual surfaces include part deformation from external mounting forces, self-weight deflection, the use of part datums to facilitate efficient alignment, and the ability to see the full aperture. The measurement of transmitted wavefronts also requires these considerations and includes requirements that are specific to characterizing a system versus a single surface. These requirements include increased degrees of freedom for alignment, the ability to measure off axis, and the ability to characterize both focal and afocal systems.
Frank DeWitt of XONOX Technology Inc. discusses the questions to consider when deciding how to approach part holding and fixturing for interferometric measurements, in light of the features that are critical to the item being measured and the required outputs of the measurement.
Who should attend:
Engineers, opticians, R&D scientists, and manufacturers who use interferometry in their work. Anyone who would like to learn more about part and sample holding, characterizing individual surfaces, and measuring transmitted wavefronts. Those in industries such as aerospace, automotive, communications, energy, medicine, nanotechnology, ophthalmology, and semiconductors.
About the presenter:
Frank DeWitt is general manager of XONOX Technology Inc. He has over 20 years of experience in the optics industry. In addition to managing the XONOX U.S. subsidiary, he leads new product development. Prior to his current role, DeWitt established JAID Technologies, where he designed, patented, and commercialized a novel mirror mount capable of extremely stable pointing in demanding conditions. Before JAID, he was director of engineering at Melles Griot Optical Systems in Rochester, N.Y., where he led a team of engineers in the development of complex optical systems for use in a variety of applications, including semiconductor metrology, DNA sequencing, and lithography.
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Date: Wednesday, January 18, 2023
Time: 1:00 PM - 2:00 PM EST
Space is limited. Reserve your Webinar seat now at: https://attendee.gotowebinar.com/register/163158057390548829?source=eblast
After registering you will receive a confirmation email containing information about joining the Webinar.
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