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Join us for a FREE webinar: "Leak Testing Sealed Laser and Photonics Components" (9/26/2019)

Join us for a FREE webinar: "Leak Testing Sealed Laser and Photonics Components"
There are several technologies used to locate and/or measure leaks. Each may have advantages in terms of cost, sensitivity, repeatability, or ease of application.
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Thursday, September 26, 2019
        
 

Join us for a FREE Webinar

Leak Testing Sealed Laser and Photonics Components

Tuesday, October 15, 2019 11:00 AM - 12:00 PM EDT

Register Now

Presented by

 
About This Webinar
 
 
There are several technologies used to locate and/or measure leaks. Each may have advantages in terms of cost, sensitivity, repeatability, or ease of application. In this webinar, Agilent Technologies will look at several and focus primarily on helium mass spectrometer leak detection. Helium used as a tracer gas readily and rapidly finds leak paths and can be detected quickly and reliably by a mass spectrometer. Helium mass spectrometry provides a rapid, sensitive, and reliable way to locate or precisely measure leaks that affect the quality or longevity of a very wide range of parts and systems.

In this webinar, you will learn:
  • The advantages and disadvantages of various leak detection technologies.
  • The different methods of locating leaks and determining leak rate, and which to employ for the product or system you need to test.
  • The advantages of helium tracer gas leak detection.
Specific topics covered:
  • What do different leak rates mean? Are there industry standards for leak testing?
  • What is the inside-out test method?
  • How do I introduce helium into my part?
    • During assembly.
    • Post-sealing (bombing).
  • What type of test fixture is used?
  • Testing do’s and don’ts.
  • Benefits of nitrogen venting.
  • What is a verification leak and how does it mistake-proof your test?
There will be ample time for attendees to ask questions.

About the presenter:
John McLaren has over 25 years of leak detection experience. Prior to joining Agilent (formerly Varian), he was involved in leak detection process development at a major automotive parts supplier. Since joining Agilent/Varian in 1995, John has held various sales, sales management, and marketing positions. In his current role, he directs product planning and development, creates specialized application solutions, and assists and trains Agilent’s global sales organization.

Who should attend:
Anyone who is involved in leak detection and who is interested in flexible, reliable solutions to locating and measuring leaks.

About Agilent Technologies:
Since its invention of the VacIon ultrahigh vacuum pump over 40 years ago, Agilent Technologies Vacuum Products Division (formerly Varian Vacuum) has maintained a leadership position in vacuum and leak detection technology for scientific and industrial applications. Agilent provides a full-range of trusted vacuum solutions to enable your challenging process or experiment. Agilent’s highly regarded training programs are staffed by dedicated professional trainers with the expertise and experience to provide comprehensive and thorough instruction on a broad range of vacuum and leak detection technologies.
 
Mark Your Calendar
 
 

Date: Tuesday, October 15, 2019

Time: 11:00 AM - 12:00 PM EDT

Space is limited. Reserve your Webinar seat now at: https://attendee.gotowebinar.com/register/1772000828117393421

After registering you will receive a confirmation email containing information about joining the Webinar.
 

SYSTEM REQUIREMENTS

PC-based attendees
Required: Windows® 10, 8, 7, Vista, XP or 2003 Server

Mac® -based attendees
Required: Mac OS® X 10.6 or newer

Mobile attendees
Required: iPhone® , iPad® , AndroidTM phone or tablet, Windows 8 or Windows Phone 8
 
More from Photonics Media
 
 

Upcoming Webinars

- Mid-Infrared Materials and Devices on a Silicon Platform: Sensors, Detectors, and Imagers, 10/1/2019 1:00:00 PM EDT
- OCT and Ophthalmology in the Age of Artificial Intelligence, 10/8/2019 1:00:00 PM EDT

Archived Webinars

- Solving Challenges in Defect Inspection of Advanced Optics
- Deposition of Uniform and Laterally Graded Optical Interference Coatings
- Waveguide Simulation with the Beam Envelope Method
 
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