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Join us for a FREE webinar: "Fundamentals of Helium Leak Detection" (4/3/2018)

Join us for a FREE webinar: "Fundamentals of Helium Leak Detection"
This 40-minute webinar, presented by Agilent Technologies, will describe the challenges of locating and measuring leaks, the importance of leak rate specification and various methods of leak detection
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Tuesday, April 3, 2018
        
 

Join us for a FREE Webinar

Fundamentals of Helium Leak Detection

Tuesday, April 17, 2018 1:00 PM - 2:00 PM EDT

Register Now

Presented by

 
About This Webinar
 
 
From LEDs to medical devices to microelectronics to fiber optics - everything leaks! This 40-minute webinar, presented by Agilent Technologies, will describe the challenges of locating and measuring leaks, the importance of leak rate specification and various methods of leak detection.

You will learn:
  • The advantages and disadvantages of various leak detection technologies.
  • The different methods of locating leaks and determining leak rate, and which method to employ for the product or system you need to test.
  • The advantages of Helium tracer gas leak detection.
Presenter John McLaren will compare the different advantages of leak detection technologies in terms of cost, sensitivity, repeatability and ease of application. He will review parts and systems that require leak testing, and discuss leak rate values to provide perspective on the "size" of leaks and their impact on the quality or life of parts and systems.

In addition to technology selection, McLaren will discuss test methods - including "outside in," "inside out," sniffing, and accumulation - and which method will be most appropriate for a given part or system. He will explore the characteristics of each method to ensure that you understand its applicability to the items you may need to test.

He will also cover the use and benefits of Helium as a tracer gas. As a light gas, Helium readily and rapidly finds leak paths and can be detected quickly and reliably by a mass spectrometer instrument. Helium mass spectrometry leak detection provides a rapid, sensitive and reliable way to locate or precisely measure leaks that impact the quality or longevity of a wide range of parts and systems.

About the presenter:
John McLaren has over 25 years of leak detection experience. Prior to joining Agilent (formerly Varian) he was involved in leak detection process development at a major automotive parts supplier. Since joining Agilent/Varian in 1995 McLaren has held various sales, sales management and marketing positions. In his current role as product marketing manager for Leak Detection, he directs product planning and development, creates specialized application solutions, and assists and trains Agilent's global sales organization.

Who should attend:
Anyone who is involved in leak detection and who is interested in flexible, reliable solutions to locating and measuring leaks.

About Agilent Technologies:
Since its invention of the VacIon ultra-high vacuum pump over 40 years ago, Agilent Technologies Vacuum Products Division (formerly Varian Vacuum) has maintained a leadership position in vacuum and leak detection technology for scientific and industrial applications. The company provides a full range of trusted vacuum solutions to enable the most challenging process or experiment. Agilent's highly-regarded training programs are staffed by dedicated professional trainers with the expertise and experience to provide comprehensive and thorough instruction on a broad range of vacuum and leak detection technologies.
 
Mark Your Calendar
 
 

Date: Tuesday, April 17, 2018

Time: 1:00 PM - 2:00 PM EDT

Space is limited. Reserve your Webinar seat now at: https://attendee.gotowebinar.com/register/7444666077425647874

After registering you will receive a confirmation email containing information about joining the Webinar.
 

SYSTEM REQUIREMENTS

PC-based attendees
Required: Windows® 10, 8, 7, Vista, XP or 2003 Server

Mac® -based attendees
Required: Mac OS® X 10.6 or newer

Mobile attendees
Required: iPhone® , iPad® , AndroidTM phone or tablet, Windows 8 or Windows Phone 8
 
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- From Layout to Multiphysics: Integrating Thermal and Photonics Simulation into the PIC Design Flow, 4/19/2018 11:00:00 AM EDT
- Selecting the Best Sensor for Your Machine Vision System, 4/24/2018 1:00:00 PM EDT

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