Search
Menu
Excelitas PCO GmbH - Industrial Camera 11-24 VS LB
< More Webinar AlertsSubscribe to our E-Newsletters

Join us for a FREE webinar: "Characterizing Photonics Devices with Transmission Electron Microscopy" (1/25/2017)

Join us for a FREE webinar: "Characterizing Photonics Devices with Transmission Electron Microscopy"
This webinar will help advance your understanding of light-matter interactions at the nanoscale, an area of science that holds great promise for increasing speed in computers and communications.
If you are having problems seeing this newsletter, please click here to view

Photonics Media presents a Free Webinar!
Photonics Media - The Pulse of the Industry

Follow us on twitter          Like us on Facebook
FREE WEBINAR
Characterizing Photonics Devices with Transmission Electron Microscopy
Join us for a Webinar on Fri, Feb 10, 2017 1:00 PM - 2:00 PM EST
This webinar will help advance your understanding of light-matter interactions at the nanoscale, an area that holds great promise for increasing speed in computers and communications.

Thanks to recent advances in electron optics, a new generation of transmission electron microscopes (TEMs) have become available which are capable of image resolutions better than 0.1 nm and spectroscopic resolutions better than 0.4 eV. The instruments can accommodate special purpose sample stages that convert these microscopes into true experimental nanomaterials laboratories, enabling experiments that are crucial to the advancement of nanoscience and nanotechnology. What does this mean for photonics technologies? Join Brookhaven's Eric Stach for this webinar to find out!

Stach will talk about the ways that TEM can be used to take images of the structure of photonics devices at the Angstrom to micron scale. He will discuss how diffraction can be used to characterize crystal structure; and how chemical spectroscopy can be used to determine chemical speciation and electronic structure at the nanoscale. He will also cover sample preparation methods that allow site-specific characterization of individual devices. Throughout his presentation he will draw on examples of applications issues from current literature, using them to share his own understanding and approach to these issues.

Stach leads the Electron Microscopy Group in the Center for Functional Nanomaterials (CFN) at the Brookhaven National Laboratory. His research focuses on the development and application of electron microscopy techniques to solve materials problems in nanostructure growth, catalysis, thin film growth and materials deformation. Stach received his Ph.D. in Materials Science and Engineering from the University of Virginia and has worked as a staff scientist and principal investigator at the National Center for Electron Microscopy at the Lawrence Berkeley National Laboratory and as a professor at Purdue University, where he retains an adjunct appointment. He is a Fellow of the Microscopy Society of America, and is a cofounder and chief technology officer of Hummingbird Scientific.



MARK YOUR CALENDAR
Date: Fri, Feb 10, 2017
Time: 1:00 PM - 2:00 PM EST


Space is limited. Reserve your Webinar seat now at:
https://attendee.gotowebinar.com/register/8691522148111390212

After registering you will receive a confirmation email containing information about joining the Webinar.



SYSTEM REQUIREMENTS
PC-based attendees
Required: Windows® 10, 8, 7, Vista, XP or 2003 Server

Mac®-based attendees
Required: Mac OS® X 10.6 or newer

Mobile attendees
Required: iPhone®, iPad®, Android™ phone or tablet, Windows 8 or Windows Phone 8




Visit Photonics Media to watch past webinars on demand to learn more about the latest developments in lasers, imaging, optics, biophotonics, machine vision, spectroscopy, microscopy, photovoltaics and more.

https://photonics.com/Webinars.aspx

Register Now!


Questions: [email protected]
Unsubscribe: https://www.photonics.com/Newsletter/EmailUnsubscribe.aspx

Subscribe | Manage Subscriptions | Privacy Policy | Terms and Conditions of Use

© 1996 - 2024 Laurin Publishing. All rights reserved.
Photonics.com is Registered with the U.S. Patent & Trademark Office.
Reproduction in whole or in part without permission is prohibited.
We use cookies to improve user experience and analyze our website traffic as stated in our Privacy Policy. By using this website, you agree to the use of cookies unless you have disabled them.