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sub-assemblies x
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automated optical inspection
Automated optical inspection (AOI) is a technology used in manufacturing processes, particularly in electronics, to automatically inspect and detect defects or anomalies in products. AOI systems use...
correlated double sampling
A technique for removing thermal noise and drift from focal plane assemblies by sampling the system output between views of scene elements and then subtracting the resulting value from the subsequent...
detector-Dewar assembly
A detector-Dewar assembly typically refers to a combination of a detector and a Dewar flask used in scientific instruments, particularly in the field of infrared spectroscopy or other applications...
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