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4 articles
Photonics Handbook
Clear All Filters x
strain measuring equipment x
Measuring Small-Beam MFD: Overcoming the Challenges
DERRICK PETERMAN, PhD, MKS Ophir
Profiling beams under 10 µm in size is one of the more challenging beam profiling applications. There are numerous reasons for this, including the very small size. Focal plane arrays commonly...
Photonic Component Manufacturing: Moving Toward Automation
Bruce W. Hueners and Michael K. Formica, Palomar Technologies
Manufacturing the laser diode is complicated by the existence of multiple proprietary techniques and intellectual property barriers together with complex device physics and unique materials. ...
SWIR Imaging: An Industrial Processing Tool
Sensors Unlimited Inc., A Collins Aerospace company
Imaging has long been used in industrial processes to measure, monitor, control, or otherwise manage the production of goods. The challenge to the process designer is to develop a tool that captures...
Spectrum Analysis for DWDM: New Instruments Meet the Challenge
Francis Audet, EXFO
As system and cable installers try to optimize their links, the preferred method has become high-speed DWDM. This demand for bandwidth has led to the development of new test and measurement...
Photonics Handbook
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