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Meadowlark Optics - Wave Plates 6/24 MR 2024
Hamamatsu Corp. - Mid-Infrared LED 9/24 HP
22 products

Photonics Products

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BC43 WF
BC43 WF
Andor Technology
  • Category: Microscopy / Microscope Systems
  • Type: Optical
BC43 SR
BC43 SR
Andor Technology
  • Category: Microscopy / Microscope Systems
  • Type: Optical
BC43 CF
BC43 CF
Andor Technology
  • Category: Microscopy / Microscope Systems
  • Type: Optical
  • Core Imaging Modes: Widefield epifluorescence. Transmitted light - brightfield and differential phase contrast
  • Imaging Methods: Single color, multicolor, z-stacking (volume), time-lapse, multi-position, multi-well, montage and 2/3D stitching
  • Imaging Modes: 3
NewView 3D Optical Profiler
NewView 3D Optical Profiler
Zygo Corporation
  • Category: Microscopy / Microscope Systems
  • Type: Optical
  • Spectral Range: VIS
Compass™ 2
Compass™ 2
Zygo Corporation
  • Category: Microscopy / Microscope Systems
  • Type: Optical
  • Spectral Range: VIS
ZeGage™ Pro
ZeGage™ Pro
Zygo Corporation
  • Category: Microscopy / Microscope Systems
  • Type: Optical
  • Spectral Range: VIS
Nexview™ NX2 3D Optical Profiler
Nexview™ NX2 3D Optical Profiler
Zygo Corporation
  • Category: Microscopy / Microscope Systems
  • Type: Optical
  • Spectral Range: VIS
Contour Elite I
Contour Elite I
Bruker Nano Surfaces
  • Category: Microscopy / Microscope Systems
  • Type: Optical
  • Magnification: 115X
  • Max Scan: 73 μm / sec
  • Max Scan Range: ≤10mm
  • Sample Height: Up to 100 mm (4 in.)
NPFLEX
NPFLEX
Bruker Nano Surfaces
  • Category: Microscopy / Microscope Systems
  • Type: Optical
  • Magnification: 115X
  • Optical Resolution: 0.33 µm
  • RMS Reapeatability: 0.004 nm
  • Vertical Resolution: <0.1 nm
Contour Elite K
Contour Elite K
Bruker Nano Surfaces
  • Category: Microscopy / Microscope Systems
  • Type: Optical
  • Magnification: 115X
  • Max Scan: 47 μm/sec
  • Max Scan Range: >10 mm
  • Sample Height: Up to 100 mm
Profilm3D<sup>&reg;</sup>
Profilm3D®
Filmetrics, KLA Instruments
  • Category: Microscopy / Microscope Systems
  • Type: Optical
  • Magnification: 100X
  • Spectral Range: VIS
S wide
S wide
Sensofar Metrology
  • Category: Microscopy / Microscope Systems
  • Type: Optical
  • Spectral Range: VIS
  • Display Resolution: 0.001 µm
  • Max. Extended Measuring area: 300 × 300 mm
  • Vertical Measuring Range: 40 mm
S neox Five Axis
S neox Five Axis
Sensofar Metrology
  • Category: Microscopy / Microscope Systems
  • Type: Optical
  • Spectral Range: VIS
S neox
S neox
Sensofar Metrology
  • Category: Microscopy / Microscope Systems
  • Type: Optical
  • Spectral Range: VIS
S mart
S mart
Sensofar Metrology
  • Category: Microscopy / Microscope Systems
  • Type: Optical
  • Spectral Range: VIS
aplanoXX
aplanoXX
AdlOptica GmbH
  • Category: Microscopy / Microscope Systems
  • Type: Optical
  • Magnification: 20X
  • Spectral Range: VIS,NIR
  • Aberration Correction: Collar
  • Clear Aperture: 20 mm
  • NA: 0.8
TopMap Micro.View+ 3D Optical Profiler
TopMap Micro.View+ 3D Optical Profiler
Polytec Inc.
  • Category: Microscopy / Other Microscopy Products
  • Type: Other
TopMap In.Line 3D Optical Profiler
TopMap In.Line 3D Optical Profiler
Polytec Inc.
  • Category: Microscopy / Other Microscopy Products
  • Type: Other
TopMap Micro.View 3D Optical Profiler
TopMap Micro.View 3D Optical Profiler
Polytec Inc.
  • Category: Microscopy / Other Microscopy Products
  • Type: Other
SPINDLE
SPINDLE
Double Helix Optics
  • Category: Microscopy / Other Microscopy Products
  • Type: Other
Active Cantilever Scanning Microscope
Active Cantilever Scanning Microscope
Seiwa Optical America Inc.
  • Category: Microscopy / Microscope Systems
  • Type: Scanning Probe
MX35 3D
MX35 3D
mechOnics AG
  • Category: Optomechanics & Positioning / Stages
  • Type: Nanopositioning Stage
  • Max. Load: 200g
  • Mass: 76g
  • Height: 36mm
  • X-Axis Travel Length: 10mm
  • Y-Axis Travel Length: 10mm
  • Z-Axis Travel Length: 10mm
  • Ambient Conditions: Standard
  • High Vacuum Preparation: 10^-6 mbar
  • Ultra-high Vacuum Prep.: 10^-9 mbar
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