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Microscopy
Microscope Systems
Other Microscopy Products
Key Suppliers
Prior Scientific Inc.
Thorlabs Inc.
Siskiyou Corporation
Andor Technology
Bruker Nano Surfaces
Applied Scientific Instrumentation Inc.
Edmund Optics
CoolLED Ltd.
Zygo Corporation
Photon etc.
DRS Daylight Solutions Inc.
Apre Instruments
Sutter Instrument Company
19 products
Microscopy
Clear All Filters x
nano materials x
Microscopy x
NewView 3D Optical Profiler
Zygo Corporation
Category:
Microscopy / Microscope Systems
Type:
Optical
Spectral Range:
VIS
Compass™ 2
Zygo Corporation
Category:
Microscopy / Microscope Systems
Type:
Optical
Spectral Range:
VIS
ZeGage™ Pro
Zygo Corporation
Category:
Microscopy / Microscope Systems
Type:
Optical
Spectral Range:
VIS
Nexview™ NX2 3D Optical Profiler
Zygo Corporation
Category:
Microscopy / Microscope Systems
Type:
Optical
Spectral Range:
VIS
Contour Elite I
Bruker Nano Surfaces
Category:
Microscopy / Microscope Systems
Type:
Optical
Magnification:
115X
Max Scan:
73 μm / sec
Max Scan Range:
≤10mm
Sample Height:
Up to 100 mm (4 in.)
MultiMode 8-HR
Bruker Nano Surfaces
Category:
Microscopy / Microscope Systems
Type:
Scanning Probe
Imaging Noise Level:
<30 pm rms
Maximum Sample Size:
15 mm dia × 5 mm thick
JPK NanoWizard AFMs
Bruker Nano Surfaces
Category:
Microscopy / Microscope Systems
Type:
Scanning Probe
Innova
Bruker Nano Surfaces
Category:
Microscopy / Microscope Systems
Type:
Scanning Probe
Closed-Loop, Large-Area Scanner:
XY >90 µm, Z >7.5 µm
Open-Loop, Small-Area Scanner:
XY >5 µm, Z >1.5 µm
Sample Size:
45 mm × 45 mm x 18 mm
Dimension FastScan
Bruker Nano Surfaces
Category:
Microscopy / Microscope Systems
Type:
Scanning Probe
Integral Nonlinearity XYZ:
<0.50%
X-Y Scan Range:
90 μm × 90 μm typical
Z Range:
10 μm typical in imaging
Dimension Edge
Bruker Nano Surfaces
Category:
Microscopy / Microscope Systems
Type:
Scanning Probe
X-Y Scan Range:
85 μm minimum
Z Range:
9.5 μm minimum
NPFLEX
Bruker Nano Surfaces
Category:
Microscopy / Microscope Systems
Type:
Optical
Magnification:
115X
Optical Resolution:
0.33 µm
RMS Reapeatability:
0.004 nm
Vertical Resolution:
<0.1 nm
DektakXT
Bruker Nano Surfaces
Category:
Microscopy / Microscope Systems
Type:
Optical
Data Points Per Scan:
120,000 max.
Stylus Force:
1 to 15 mg with LIS 3 sensor
Vertical Range:
1 mm
Dektak XTL
Bruker Nano Surfaces
Category:
Microscopy / Microscope Systems
Type:
Optical
Stylus Force:
0.03 mg to 15 mg
Vertical Range:
1 mm
Vertical Resolution:
1Å max. (@6.55 µm range)
Contour Elite K
Bruker Nano Surfaces
Category:
Microscopy / Microscope Systems
Type:
Optical
Magnification:
115X
Max Scan:
47 μm/sec
Max Scan Range:
>10 mm
Sample Height:
Up to 100 mm
Dimension Icon
Bruker Nano Surfaces
Category:
Microscopy / Microscope Systems
Type:
Scanning Probe
Integral nonlinearity XYZ:
<0.5% typical
X-Y scan range:
90 μm x 90 μm typical
Z range:
10 μm typical in imaging
NanoScan OP400
Prior Scientific Instruments Ltd.
Category:
Microscopy / Other Microscopy Products
Type:
Other
Travel Range - closed loop:
400µ
Travel Range - open loop:
480µ
Active Cantilever Scanning Microscope
Seiwa Optical America Inc.
Category:
Microscopy / Microscope Systems
Type:
Scanning Probe
Cube II Tabletop SEM
NanoImages
Category:
Microscopy / Microscope Systems
Type:
Electron
Resolution:
5nm
Kv:
1-30 kV adjustable
Max. Sample Size:
140 mm horizon 80 mm tall
Pump Down Time:
90 s
Model 4200M
Hinalea Imaging
Category:
Microscopy / Microscope Systems
Type:
Optical
Spectral Range:
VIS,NIR
Number of Spectral Bands:
300 nominal, 600 maximum
Sensor Spatial Resolution:
2.3
Spectral Range:
4-0 - 1,000 nm
Microscopy Products
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