Register
Sign In
Suppliers
Products
Categories
Handbook
Dictionary
Careers
Resources
Photonics Spectra
BioPhotonics
Vision Spectra
Virtual Events & Summits
Educational Institutions
Add/Update Your Listing
Exhibitor Listing Portal
Become an Exhibitor
Buyers' Guide Print Edition
Marketplace Help
Subscribe
Advertise
Suppliers
Products
Categories
Handbook
Dictionary
Careers
Resources
Photonics Spectra
BioPhotonics
Vision Spectra
Virtual Events & Summits
Educational Institutions
Add/Update Your Listing
Exhibitor Listing Portal
Become an Exhibitor
Buyers' Guide Print Edition
Marketplace Help
Register
Sign In
Photonics Marketplace
Suppliers
Products
Handbook
Institutions
Dictionary
Show Filters
Hide Filters
Products by Category
< All Categories
< Microscopy
< Microscope Systems
Scanning Probe
Applications
Industrial
Life Science
Material Science
Medical/Clinical Science
Magnification
Optical
-
X
Spectral Range
Optical
FIR
LWIR
MWIR
NIR
SWIR
UV
VIS
XRAY
Resolution
Electron/Scanning Probe
-
pm
nm
µm
Key Suppliers
Bruker Nano Surfaces
9 products
Microscope Systems: Scanning Probe
Clear All Filters x
probe x
Microscopy x
Microscope Systems x
Scanning Probe x
MultiMode 8-HR
Bruker Nano Surfaces
Imaging Noise Level:
<30 pm rms
Maximum Sample Size:
15 mm dia × 5 mm thick
JPK NanoWizard AFMs
Bruker Nano Surfaces
Innova
Bruker Nano Surfaces
Closed-Loop, Large-Area Scanner:
XY >90 µm, Z >7.5 µm
Open-Loop, Small-Area Scanner:
XY >5 µm, Z >1.5 µm
Sample Size:
45 mm × 45 mm x 18 mm
Dimension FastScan Bio
Bruker Nano Surfaces
Sample Environment — Flow Cell:
60 μL
X-Y Tip-Velocity Max.:
>2 mm/s
Z Range:
≥3 μm
Dimension FastScan
Bruker Nano Surfaces
Integral Nonlinearity XYZ:
<0.50%
X-Y Scan Range:
90 μm × 90 μm typical
Z Range:
10 μm typical in imaging
Dimension Edge
Bruker Nano Surfaces
X-Y Scan Range:
85 μm minimum
Z Range:
9.5 μm minimum
Ultima Multiphoton
Bruker Nano Surfaces
Scan Size:
64 x 64 to 2048 x 2048
Scanning Method:
Pair of 6mm galvanometers
Dimension Icon
Bruker Nano Surfaces
Integral nonlinearity XYZ:
<0.5% typical
X-Y scan range:
90 μm x 90 μm typical
Z range:
10 μm typical in imaging
Active Cantilever Scanning Microscope
Seiwa Optical America Inc.
Microscope Systems: Scanning Probe Products
Need Help?
Explore Our Content
News
Features
Latest Products
Webinars
White Papers
All Things Photonics Podcast
Videos
Our Summits & Conferences
Industry Events
Bookstore
Join Our Community
Subscribe
Advertise
Become a member
Sign in
Contribute a Feature
Suggest a Webinar
Submit a Press Release
Mobile Apps
About Us
Our Company
Our Publications
Contact Us
Career Opportunities
Teddi C. Laurin Scholarship
Terms & Conditions
Privacy Policy
California Consumer Privacy Act (CCPA)
©2024 Photonics Media
100 West St.
Pittsfield, MA, 01201 USA
[email protected]
We use cookies to improve user experience and analyze our website traffic as stated in our
Privacy Policy
. By using this website, you agree to the use of
cookies
unless you have disabled them.