Search
Menu
Bristol Instruments, Inc. - 872 Series LWM 10/24 LB
Photonics Dictionary

x-ray phase contrast microscopy

Used for high-resolution surface study with subnanometer resolution. XRIM uses interfacial phase contrast with application of hard x-rays over elementary surface structures availing the observation of defect structures .6 nm high on a solid surface.
We use cookies to improve user experience and analyze our website traffic as stated in our Privacy Policy. By using this website, you agree to the use of cookies unless you have disabled them.