Full company details
Radiant Vision Systems
A Konica Minolta Co.
Test & Measurement
18640 NE 67th Court
Redmond, WA 98052
United States
Phone: +1 425-844-0152
Fax: +1 425-844-0153
20X Microscope Lens
Displays continue to increase in resolution and pixel density. Microdisplays such as those used for AR/VR/MR devices and smart watches can have hundreds or even thousands of pixels per inch (PPI). At the same time, these pixels and their subpixels can be as small as a few microns across. Manufacturers need to measure much smaller elements than ever before to ensure accuracy of light output, color, and other qualities.
This is especially true of emissive displays like OLED, LED, microLED, or microOLED where each pixel in a display produces its own luminance and therefore can vary in output from pixel to pixel. These individual variations (called mura) can cause nonuniformity of the display that is visible even at a distance, especially when viewing the display at high, bright states.
The 20X Microscope lens can be used with a ProMetric Y-series Imaging Photometer for luminance-only measurement or a ProMetric I-series Imaging Colorimeter for measuring values of luminance and chromaticity. Extensive data analysis and display functions are also supported, including isometric plots, cross-sectional graphs, radar plots, and bitmaps.
The magnification of the 20X Microscope Lens enables the imaging colorimeter or photometer to focus a greater number of image sensor pixels per display pixel for fine-detail measurement. Paired with a ProMetric
® Imaging Photometer or Colorimeter, it enables users to acquire more precise pixel detail and increase the consistency of accurate measurements. The lens magnifies details of the display sensor while capturing display pixels and subpixels over several sensor pixels of high-resolution (61 MP) image sensors for increased measurement precision. This combination of value, high performance, and flexibility offers manufactures easy-to-use measurement control, optimizing testing efficiency and supporting advanced analysis.
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