Verifire

• Company: Zygo Corporation
• Type: Semiconductor
• Max. Power: 3mW
• Classification (IEC): Class 3R
• Wavelength: 633nm
• Operating Mode: Continuous
• Beam Diam.: 102mm
• Applications: Metrology

The Verifire™ interferometer system provides fast and reliable measurements of surface form error, and transmitted wavefront of optical components, systems and assemblies.

A true laser Fizeau design, the Verifire™ system expands upon ZYGO's unmatched experience in surface form metrology. The ZYGO-manufactured HeNe laser source combined with ZYGO's patented acquisition algorithms and full-featured Mx™ metrology software, enables high-precision metrology with easy to use analysis capabilities.