- Company: Bruker Nano Surfaces
- Type: Scanning Probe
- Applications: Medical/Clinical Science, Life Science, Industrial, Material Science
- X-Y Scan Range: 90 μm × 90 μm typical
- Z Range: 10 μm typical in imaging
- Integral Nonlinearity XYZ: <0.50%
The Dimension FastScanTM atomic force microscope (AFM) delivers, for the first time, extreme imaging speed without sacrificing resolution and performance. This enables radically fast time to publishable data for all levels of AFM expertise.
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