- Company: EVK DI Kerschhaggl GmbH
- Type: Other
- Scan Type & Rate: Line Scan
- Interface: GigE
- Spectral Range: NIR, SWIR
- Applications: Industrial, Scientific Research
Hyperspectral camera with an integrated classification system. This powerful analysis system is based on non-contact and non-destructive short-wave infrared imaging spectroscopy.
The EVK HELIOS system analyzes the chemical properties of objects and distinguishes material types that are not visible to color cameras. The integrated analysis system provides qualitative and quantitative information about material flows, such as analyte concentrations or material compositions.
Technical Details:
-Spectral range in near infrared (NIR) and shortwave infrared (SWIR): 930 – 1700 nm
-Scan rate from 446 Hz full spectrum (248 spectral bands) up to 3.8 kHz with ROI
-Internal camera calibration – optically corrected output data
-Excellent signal-to-noise ratio
-GigE Vision/GenICam interface
-Robust, industrial design. Protection class IP54
-Temperature range 0°C – 45°C with full optical stability
-Design optimized for analytical applications
-Seamless connection to the EVK SQALAR software suite