- Company: Yokogawa Test&Measurement
- Type: Benchtop
- Measurement Techniques: Absorption, Emission, Fluorescence, FTIR, Mass Spectrometry, Reflectance and Transmission, Inelastic Scattering, Raman, Other
- Spectral Range (nm): 350 - 1750
- Max. Resolution (nm): 0.05
- Pixel Count (total pixels): 786432
- Width: 426mm
- Length: 459mm
- Height: 221mm
- Weight (kg): 19
- Applications: Biomedical/Medical, Defense, Environmental Monitoring, Light Characterization, Materials Identification, Scientific Research, Semiconductor, Other
- Wavelength Accuracy: ±0.05nm (633/1523nm), ±0.2nm(350-1750nm)
- Close-In Dynamic Range: 60 dB (λPK ±1 nm)
- Sensitivity: -80dBm (900-1600nm), -70dBm (400-900nm)
- Wide Level Range: +20 to -80dBm
- Built-In Cut Filter: High order diffracted light
- Free Space Input: Can use SM or MM fibers
Covers wavelengths from 350-1750 nm, including visible light (380-780 nm) and telecommunication wavelengths.
Eight wavelength resolution settings (0.05-10 nm) to select best value according to system/DUT.
Performs 100nm span in 0.5 seconds.
Capable of large number of samples, one sweep measures wider wavelength range at high resolution.
Trace features include 7 individual traces, simultaneous multi-trace display, calculation between traces (subtraction between traces), Max/Min Hold function. Use all-at-once trace filing feature to save all-in-one CSV file for easy manipulation with PC application software.
Multiple data analysis functions: WDM (OSNR), optical fiber amplifier, DFB-LD, FP-LD (VCSEL), LED, spectral width, notch width, SMSR, PMD, optical power, color, Go/No-Go judgement, optical filter (PK, BTM, WDM-PK, WDM-BTM).
Automatic built-in calibration source: optical path alignment (level accuracy) and wavelength calibration (to reference source).