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Mad City Labs Inc.

2524 Todd Dr.
Madison, WI 53713
United States

Phone: +1 608-298-0855

Fax: +1 608-298-9525

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Resonant Probe AFM: Uses and Advantages

Author: James F. MacKay Monday, July 3, 2023
A resonant probe atomic force microscope (AFM) offers capabilities and benefits not found in commonly used optical deflection AFMs in the measurement of physical constants, physical properties, and surface morphology. This article discusses resonant probe AFM construction, functionality. Some of the applications particularly well suited to resonant probe AFM are optical antenna properties, quantum materials (NV center research), and terahertz microscopy/spectroscopy.

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File: V2_12693_1_Resonant_probe_AFM_0420_corrected_.pdf (279.01 KB)
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