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Photonics Suppliers Atomic Force Microscopes

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Mad City Labs Inc.

2524 Todd Dr.
Madison, WI 53713
United States

Phone: +1 608-298-0855

Fax: +1 608-298-9525

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Near-Field Scanning Optical Microscopes: Capabilities and Applications

Author: James F. MacKay and Beau Brossman Wednesday, March 10, 2021
NSOM techniques and instrumentation have evolved to become vital tools for material characterization, providing high-quality data and continually expanding utility, spot-on accuracy, adaptability, and exceptionally high definition. This article examines apertured and apertureless NSOM equipment and techniques: how they are achieved, what information they can provide, and applications in which they excel.

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File: NSOM_Capabilities_and_Applications.pdf (164.80 KB)
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