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Excelitas Technologies Corp. - X-Cite Vitae LB 11/24
Photonics SuppliersUsed/Surplus Test and Analysis Equipment

J.A. Woollam

Map311 South 7th St.
Lincoln, NE 68508
United States
Phone: +1 402-477-7501
Fax: +1 402-477-8214
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Manufactures spectroscopic ellipsometers for thin-film characterization. Measures thickness and refractive index with subnanometer resolution. Characterizes material properties over a wide range from VUV to IR (142 nm to 30 microns). Measurement services available.
Established: 1987
Employees: 70
Facility area (sq ft): 15,000
Ownership type: Privately Owned
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