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Photonics Suppliers
Infrared Spectrum Measuring Instruments
J.A. Woollam
311 South 7th St.
Lincoln, NE 68508
United States
Phone:
+1 402-477-7501
Fax:
+1 402-477-8214
Call Now
Email Company
Visit Website
Manufactures spectroscopic ellipsometers for thin-film characterization. Measures thickness and refractive index with subnanometer resolution. Characterizes material properties over a wide range from VUV to IR (142 nm to 30 microns). Measurement services available.
Established:
1987
Employees:
70
Facility area (sq ft):
15,000
Ownership type:
Privately Owned
Collapse All
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Product & Service Categories
MS
=Manufacture Stock |
MC
=Manufacture Custom |
S
=Supply/Distribute |
D
=Design
( MS )
Coating Testing and Monitoring Equipment
( MS )
Ellipsometers
( MS )
Film Thickness Gauges, Optical
( MS )
Film Thickness Monitors
( MS )
Gauges, Thickness, Optical
[
+
] Spectrum Measuring Instruments
( MS )
Infrared
( MS )
Ultraviolet
( MS )
Visible
( S )
Testing, Spectrometric
( S )
Used/Surplus Test and Analysis Equipment
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