Register
Sign In
Suppliers
Products
Categories
Handbook
Dictionary
Careers
Resources
Photonics Spectra
BioPhotonics
Vision Spectra
Virtual Events & Summits
Educational Institutions
Add/Update Your Listing
Exhibitor Listing Portal
Become an Exhibitor
Buyers' Guide Print Edition
Marketplace Help
Subscribe
Advertise
Suppliers
Products
Categories
Handbook
Dictionary
Careers
Resources
Photonics Spectra
BioPhotonics
Vision Spectra
Virtual Events & Summits
Educational Institutions
Add/Update Your Listing
Exhibitor Listing Portal
Become an Exhibitor
Buyers' Guide Print Edition
Marketplace Help
Register
Sign In
Photonics Suppliers
Test & Measurement
Scanning Probe Microscopes
Full company details
Bruker Nano Surfaces
Div. of Bruker Corp.
5255 E Williams Circle, Suite 2080
Tucson, AZ 85711
United States
Phone:
+1 520-741-1044
Fax:
+1 520-294-1799
Toll-free:
+1 800-873-9750
Call Now
Email Company
Visit Website
White Papers, Application Notes, & Data Sheets
Spatiospectral Nanoimaging of Surface Phonon Plasmons
Surface plasmon polaritons (SPPs) in 2D materials enhance light-matter interaction and enable development of super lenses, subwavelength metamaterials, and other photonic devices. In-situ...
Full-Field Hotspot Detection and High-Resolution Topographic Characterization of Post-CMP Wafers with 3D Optical Profiling
Traditional methods of post-CMP process evaluation have analytical limitations that, in light of tightening process control limits, do not meet the growing need for more accurate wafer surface...
Characterization of Advanced Semiconductor Materials and Processes with Nanoscale IR Spectroscopy
This application note demonstrates the successful application of Tapping AFM-IR to distinguish the chemical footprints of several nanoscale lithographic patterns consisting of complex molecular...
Characterization of Advanced Semiconductor Materials and Processes with Nanoscale IR Spectroscopy
This application note demonstrates the successful application of Tapping AFM-IR to distinguish the chemical footprints of several nanoscale lithographic patterns consisting of complex molecular...
USI Universal Adaptive Profiling Measurement Mode for Superior Surface Texture Characterization
Bruker has recently released the Universal Scanning Interferometry (USI) measurement mode to enable universal measurement results on wide-ranging surfaces for ContourX white light interferometry...
Advantages of Measuring Surface Roughness with White Light Interferometry
This application note discusses the use of mean roughness measurements with white light interferometry (WLI) optical profilers. Spatial filters are explained, as well as some of the normative...
Improving Additive Manufacturing with Accurate Surface Metrology
Standard manufacturing formative techniques (e.g., molding, injecting, casting, stamping, forging) and subtractive processes (e.g., CNC milling and turning, drilling, cutting) are being challenged by...
High-Resolution Chemical Imaging with Tapping AFM-IR
Where the spatial resolution of conventional bulk IR spectroscopy is limited by diffraction to ~3-10 µm, atomic force microscopy (AFM) provides a nanoscale topographic map of a sample surface....
Explore Our Content
News
Features
Latest Products
Webinars
White Papers
All Things Photonics Podcast
Videos
Our Summits & Conferences
Industry Events
Bookstore
Join Our Community
Subscribe
Advertise
Become a member
Sign in
Contribute a Feature
Suggest a Webinar
Submit a Press Release
Mobile Apps
About Us
Our Company
Our Publications
Contact Us
Career Opportunities
Teddi C. Laurin Scholarship
Terms & Conditions
Privacy Policy
California Consumer Privacy Act (CCPA)
©2024 Photonics Media
100 West St.
Pittsfield, MA, 01201 USA
[email protected]
Requesting information about:
*
First Name:
*
Last Name:
*
Email Address:
*
Company:
*
Country:
Please select your country
Afghanistan
Albania
Algeria
American Samoa
Andorra
Angola
Anguilla
Antigua and Barbuda
Argentina
Armenia
Aruba
Ascension Island
Australia
Austria
Azerbaijan
Bahamas
Bahrain
Bangladesh
Barbados
Belarus
Belgium
Belize
Benin
Bermuda
Bhutan
Bolivia
Bonaire
Bosnia & Herzegovina
Botswana
Brazil
British Indian Ocean Territory
Brunei Darussalam
Bulgaria
Burkina Faso
Burundi
Cambodia
Cameroon
Canada
Cape Verde
Cayman Islands
Central African Republic
Chad
Chile
China
Colombia
Comoros
Congo
Cook Islands
Costa Rica
Croatia
Cuba
Curacao
Cyprus
Czech Republic
Denmark
Djibouti
Dominica
Dominican Republic
Ecuador
Egypt
El Salvador
Equatorial Guinea
Eritrea
Estonia
Eswatini
Ethiopia
Falkland Islands
Faroe Islands
Fiji
Finland
France
French Guiana
French Polynesia
Gabon
Gambia
Gaza
Georgia
Germany
Ghana
Gibraltar
Greece
Greenland
Grenada
Guadeloupe
Guam
Guatemala
Guernsey
Guinea
Guinea-Bissau
Guyana
Haiti
Honduras
Hong Kong
Hungary
Iceland
India
Indonesia
Iran
Iraq
Ireland
Isle of Man
Israel
Italy
Ivory Coast
Jamaica
Japan
Jersey
Jordan
Kazakhstan
Kenya
Kiribati
Kosovo
Kuwait
Kyrgyzstan
Laos
Latvia
Lebanon
Lesotho
Liberia
Libya
Liechtenstein
Lithuania
Luxembourg
Macao
Madagascar
Malawi
Malaysia
Maldives
Mali
Malta
Marshall Islands
Martinique
Mauritania
Mauritius
Mexico
Micronesia
Moldova
Monaco
Mongolia
Montenegro
Montserrat
Morocco
Mozambique
Myanmar
Namibia
Nauru
Nepal
Netherlands
New Caledonia
New Zealand
Nicaragua
Niger
Nigeria
Niue
Norfolk Island
North Korea
North Macedonia
Northern Mariana Islands
Norway
Oman
Pakistan
Palau
Palestine
Panama
Papua New Guinea
Paraguay
Peru
Philippines
Pitcairn Islands
Poland
Portugal
Puerto Rico
Qatar
Reunion
Romania
Russia
Rwanda
Saint Helena
Saint Kitts and Nevis
Saint Lucia
Saint Vincent and the Grenadines
Samoa
San Marino
Sao Tome and Principe
Saudi Arabia
Senegal
Serbia
Seychelles
Sierra Leone
Singapore
Slovakia
Slovenia
Solomon Islands
Somalia
South Africa
South Korea
South Sudan
Spain
Sri Lanka
Sudan
Suriname
Sweden
Switzerland
Syria
Taiwan
Tajikistan
Tanzania
Thailand
Timor-Leste
Togo
Tonga
Trinidad and Tobago
Tunisia
Turkey
Turkmenistan
Turks and Caicos
Tuvalu
Uganda
Ukraine
United Arab Emirates
United Kingdom
United States
Uruguay
Uzbekistan
Vanuatu
Vatican City State
Venezuela
Vietnam
Virgin Islands - British
Virgin Islands - U.S.
Yemen
Zambia
Zimbabwe
Message:
When you click "Send Request", we will record and send your personal contact information to the supplier by email so they may respond directly. You also agree that Photonics Media may contact you with information related to this inquiry, and that you have read and accept our
Privacy Policy
and
Terms and Conditions of Use
.
* Required
X
Are you interested in this company?
When you click "Send Request", we will send the contact details you supply to
Bruker Nano Surfaces
so they may respond to your inquiry directly.
Email Address:
Name:
Company:
Message:
Please send me more information about your company: Bruker Nano Surfaces
We use cookies to improve user experience and analyze our website traffic as stated in our
Privacy Policy
. By using this website, you agree to the use of
cookies
unless you have disabled them.