Search
Menu
Photonics SuppliersCameras & Imaging
Full company details
Bruker Nano Surfaces
Div. of Bruker Corp.
Map5255 E Williams Circle, Suite 2080
Tucson, AZ 85711
United States
Phone: +1 520-741-1044
Fax: +1 520-294-1799
Toll-free: +1 800-873-9750

High-Resolution Chemical Imaging with Tapping AFM-IR

Author: Anirban Roy, PhD (Bruker nanoIR Applications Scientist) and Dean Dawson (Bruker nanoIR Spectroscopy Business Manager) Monday, April 1, 2019
Where the spatial resolution of conventional bulk IR spectroscopy is limited by diffraction to ~3-10 µm, atomic force microscopy (AFM) provides a nanoscale topographic map of a sample surface. However, AFM has been unable traditionally to chemically characterize materials. This article discusses Tapping AFM-IR, which is a photothermal technique that combines AFM and IR spectroscopy to unambiguously identify the chemical composition of a sample with tens-of-nanometers spatial resolution.

More white papers
Download White Paper
File: High_Resolution_Chemical_Imaging2.pdf (479.27 KB)
To download this white paper, please complete the *required fields before clicking the "Download" button.
Your contact information
* First Name:
* Last Name:
* Email Address:
* Company:
Address:
Address 2:
City:
State/Province:
Postal Code:
* Country:
Phone #:
Fax #:

Register or login to auto-populate this form:
Login Register
* Required

When you click "Send Request", we will record and send your personal contact information to Bruker Nano Surfaces by email so they may respond directly. You also agree that Photonics Media may contact you with information related to this inquiry, and that you have read and accept our Privacy Policy and Terms and Conditions of Use.
We use cookies to improve user experience and analyze our website traffic as stated in our Privacy Policy. By using this website, you agree to the use of cookies unless you have disabled them.