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Photonics Suppliers Film Thickness Monitors

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Bruker Nano Surfaces
Div. of Bruker Corp.

5255 E Williams Circle, Suite 2080
Tucson, AZ 85711
United States

Phone: +1 520-741-1044

Fax: +1 520-294-1799

Toll-free: +1 800-873-9750

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USI Universal Adaptive Profiling Measurement Mode for Superior Surface Texture Characterization

Author: Stephen Hopkins Tuesday, December 1, 2020
Bruker has recently released the Universal Scanning Interferometry (USI) measurement mode to enable universal measurement results on wide-ranging surfaces for ContourX white light interferometry (WLI) profilometers. USI provides fully automated, self-sensing surface texture optimized signal processing while delivering the most accurate and realistic computation of the surface topography being analyzed.

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File: Universal_Adaptive_Profiling_Measurement_Mode.pdf (3.68 MB)
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