Photonics Device Probing Test System Model 58635

Name: Photonics Device Probing Test System Model 58635
Rating: 5 (1 reviews)

About Chroma ATE Inc.

Request Quote

Download Data Sheet

Type: System
Wafer Size: 2~6 inch
Wafer Thickness: 100~3,000 µm
Wafer Warpage: ≦10 mm
Chip Size: ≧150 µm
Optical Power: 0.1~5,000 mW
Wavelength: 800~1,000 nm

Photonics Device Probing Test System Model 58635

Similar Marketplace Products

Water-Cooled Beam Dump 990-0820 - EKSMA Optics

F-Theta Lens for 1064 nm - EKSMA Optics

Fixed Ratio Beam Expanders for High Power Lasers - EKSMA Optics

Compact Variable Laser Power Attenuators 990-0077, 990-0078 - EKSMA Optics

Assembled Optical and Optomechanical Systems - Tecnottica Consonni srl

Explore Our Content
News
Feature Articles
Latest Products
Webinars
White Papers
All Things Photonics Podcast
Photonics Spectra Now
Videos
Our Summits & Conferences
Industry Events
Bookstore

Join Our Community
Subscribe
Advertise
Become a member
Sign in
Contribute a Feature
Suggest a Webinar
Submit a Press Release
Mobile Apps

About Us
Our Company
Our Publications
Contact Us
Career Opportunities
Teddi C. Laurin Scholarship

Terms & Conditions
Privacy Policy
California Consumer Privacy Act (CCPA)

Requesting information about:

* First Name:

* Last Name:

* Email Address:

* Company:

* Country:

Message:

When you click "Send Request", we will record and send your personal contact information to the supplier by email so they may respond directly. You also agree that Photonics Media may contact you with information related to this inquiry, and that you have read and accept our Privacy Policy and Terms and Conditions of Use.

* Required

We use cookies to improve user experience and analyze our website traffic as stated in our Privacy Policy. By using this website, you agree to the use of cookies unless you have disabled them.