In-Process Wafer Die Inspection System Model 7945

Name: In-Process Wafer Die Inspection System Model 7945
Rating: 5 (1 reviews)

About Chroma ATE Inc.

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Type: System
Wafer Size: ≤ 8 inch
Camera: 25M color camera × 2
Magnification: 2×, 5× and 10×
Resolution: 1.28µm/pixel
Power: AC 220V±10%
Operation Temperature: +5˚C ~40˚C

In-Process Wafer Die Inspection System Model 7945

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