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Photonics Suppliers Microscopy

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Bruker Nano Surfaces
Div. of Bruker Corp.

5255 E Williams Circle, Suite 2080
Tucson, AZ 85711
United States

Phone: +1 520-741-1044

Fax: +1 520-294-1799

Toll-free: +1 800-873-9750

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Full Characterization of Microlenses Using White Light Interferometry

Author: Roger Posusta and Samuel Lesko Wednesday, August 27, 2025
Microlenses are used in applications from coupling light into fiber optics and improving light source uniformity in micro-displays to focusing light onto imaging sensors in mobile phone cameras. White light interferometry (WLI) platforms can be used to achieve accurate and efficient characterization of microlenses, especially those that are aspherical. This note discusses use of Bruker white light interferometry (WLI) platforms for characterizing microlenses, an overview of lens development and WLI, and how WLI can best be utilized to advance microlens research and QA/QC.

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File: Full_Characterization_of_Microlenses_Using_WLI.pdf (2.39 MB)
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