Full company details
Bruker Nano Surfaces
Div. of Bruker Corp.
5255 E Williams Circle, Suite 2080
Tucson, AZ 85711
United States
Phone: +1 520-741-1044
Fax: +1 520-294-1799
Toll-free: +1 800-873-9750
Thickness Measurements of Opaque and Transparent Films or Coatings with WLI
Author: Roger Posusta, Sandra Bergman, Erica Erickson
Thursday, September 25, 2025
Accurate control over film thickness and uniformity is essential for throughput and performance in the automotive, aerospace, semiconductor, medical, and research industries. The modern standard for 3D, non-contact measurements of surface topography and texture is white light interferometry (WLI), also known as coherence scanning interferometry (CSI). It is the only method that provides film thickness, coating uniformity information, and roughness of both film and substrate over large areas, all in a single measurement that takes only a few seconds to obtain.
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