Agilent Acquires Novelx

Novelx, a Lafayette, Calif.-based maker of field emission scanning electron microscopes (SEMs), has been acquired by measurement company Agilent Technologies for an undisclosed amount, Novelx announced on its Web site.

Novelx, which was incorporated in 2002 to make low-cost, high-resolution electron beam columns for inspection, analysis and lithography applications, is now part of Agilent’s nanomeasurement operation within the company’s electronic measurement group.

Of particular commercial interest to Agilent is Novelx's first product, the mySEM (at left), which is a finalist in the Detectors, Sensing & Imaging Systems category for the 2009 Prism Awards for photonics innovation, sponsored by SPIE and Laurin Publishing/Photonics Media. Powered by the company's patented stacked silicon technology, mySEM is a compact, research-grade SEM that can be installed easily into available lab space or closer to production lines to image and characterize energy-sensitive nanomaterials, biomaterials, polymers, thin films and membranes. At a fraction of the cost, mySEM has capabilities previously available only in high-end field emission SEMs.

“The exciting SEM technology developed by Novelx over the past several years will expand both the breadth and depth of our product portfolio, which at present includes high-precision atomic force microscopes and nanomechanical test instruments,” said Jeff Jones, head of Agilent’s nanomeasurement operation. “Our first priority is to see that Novelx-engineered products achieve full compliance with all applicable worldwide regulatory requirements.”

“We’re very pleased to join Agilent Technologies,” said Dr. Lawrence Muray, former president and co-founder of Novelx. “The substantial resources, exceptional technical expertise and true global market presence of Agilent will help Novelx innovations like the mySEM transform research around the world.”

Agilent is also a 2009 Prism Awards finalist in the Analytical, Test & Measurement category for its scanning microwave microscopy mode, an atomic force microscopy method designed to enable quantitative electromagnetic materials characterization at high resolution. The Prism winners will be announced Jan. 27 at a gala awards dinner held during SPIE Photonics West in San Francisco.

For more information, visit: www.agilent.com or www.novelx.com