Andor Shows Shamrocks

Andor Technology's new Shamrock SR-500 and SR-750 spectrographs are among products it is exhibiting at Pittcon 2008 (Booth 4104), being held this week in New Orleans.

Andor said the new Shamrock models, both based on Czerny-Turner optical design, provide high resolution with greater detail and clarity in applications including Raman and fluorescence spectroscopy. Direct and responsive control of the spectrograph and camera are possible with Andor Solis software (included), enabling users to adjust the wavelength, grating selection, shutter control and filter selection, and to join spectra together.

The SR-750, Andor's newest long focal length dual-port spectrograph with scanning capabilities, has an f/9.8 aperture, 1.1-nm/mm reciprocal dispersion and 0.03-nm wavelength resolution. Both offer a 0 to 1200-nm mechanical scan range, ±0.2-nm wavelength accuracy and a 28 x 14-mm focal plane.

The SR-500 has an f/6.5 aperture, 1.7-nm/mm reciprocal dispersion and 0.05-nm wavelength resolution.

Both the SR-500 and SR-75- are available with a prealigned detector/spectrometer option enabling seamless integration of software, electronics, optics and detector. A fast and interactive graphical software interface provides full control of all the spectrograph functions.

Andor is also displaying its camera line, including the Newton EMCCD camera for spectroscopy with USB 2.0 connectivity, low-noise electronics, multi-MHz and kHz readout, up to 95 percent peak quantum efficiency and TE cooling to -100°C, and the iDus InGaAs detector, with high sensitivity and high resolution offering TE cooling down to -85°C, USB 2.0 interface, 1.7 µm and 2.2 µm sensor options and 512 or 1024 element linear photodiode arrays for near-infrared spectroscopy.

For more information, visit: www.pittcon.org/