Candela Instruments Introduces Automated Surface Inspection System for Optoelectronic Substrates

FREMONT, Calif., Aug. 13 -- Candela Instruments announces the availability of an Optical Surface Analyzer (OSA) for substrates used in the manufacture of active and passive optoelectronic devices. The C1 offers a combination of surface inspection and metrology applications, making it a versatile system for substrate qualification, yield improvement or contamination control.
Available with manual or automated handling for up to 200-mm-diam substrates, the C1 is suitable for use in laboratories, pilot lines or volume manufacturing lines.