Cambridge Research & Instrumentation (CRI) Inc., a provider of liquid-crystal-based imaging technology, and Hinds Instruments Inc., a Hillsboro, Ore., developer of birefringence measurement technology, have formed an alliance under which Hinds will market the Woburn, Mass., company’s LC-PolScope metrology imaging systems to industrial customers worldwide.
The systems determine birefringence in various materials and are used to map retardance (in nanometers) and slow-axis orientation as gray-scale images. Their addition to Hinds’ technology enables customers to perform image-based measurement both on and off the microscope.

Start a discussion on this article or any photonics topic in the Photonics.com Community Forum