ULM, Germany, Sept. 14, 2012 — WITec GmbH’s TrueSurface microscopy is now available as an integrated option for the alpha300 microscope series.
This development enables topographic Raman imaging on large samples for the full range of WITec instruments. The new imaging mode is also available as an upgrade for installed alpha300 and alpha500 systems.
The functional core of the measurement mode is the sensor for optical profilometry, now fixed in the microscope objective turret. The system measures the surface topography of large samples and correlates it with confocal Raman microscopy, enabling very rough or heavily inclined samples to be chemically characterized precisely, automatically and easily, while also being confocally imaged. Extensive, time-consuming sample preparation is rendered obsolete.
Users can undertake macroscopic investigations along the surface of a sample on the millimeter scale, while performing microscopic 3-D Raman imaging measurements on the submicron scale. The integration of an optical profilometer in a Raman microscope opens up new possibilities in surface analysis.