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DataRay Inc. - ISO 11146-Compliant Laser Beam Profilers
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Test & Measurement Articles

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Imaging Colorimetry: Accuracy in Display and Light Source MetrologyImaging Colorimetry: Accuracy in Display and Light Source Metrology
Ron Rykowski and Hubert Kostal, Radiant Imaging, Inc.
The market for flat panel displays (FPDs) has undergone tremendous growth, driven mostly by increased demand for televisions, cell phones, computers, digital cameras and MP3 players. Similarly,...
Measuring Aspheres: Selecting the Best TechniqueMeasuring Aspheres: Selecting the Best Technique
Amy Frantz, Edmund Optics Inc.
The benefits of aspheric lenses are numerous: They allow for a reduction in spherical aberrations and are ideal for focusing or collimating light, as they can achieve a low ƒ-number. Aspheres...
Measuring Surface Roughness: The Benefits of Laser Confocal MicroscopyMeasuring Surface Roughness: The Benefits of Laser Confocal Microscopy
ROBERT BELLINGER, Evident
When evaluating the surface of a component, surface roughness can be assessed by eye or by rubbing it with a fingertip. Common expressions include “shiny,” “lusterless and...
Measuring Small-Beam MFD: Overcoming the ChallengesMeasuring Small-Beam MFD: Overcoming the Challenges
DERRICK PETERMAN, PhD, MKS Ophir
Profiling beams under 10 µm in size is one of the more challenging beam profiling applications. There are numerous reasons for this, including the very small size. Focal plane arrays commonly...
Laser Measurement Systems: Best PracticesLaser Measurement Systems: Best Practices
JOHN MCCAULEY, MKS Ophir
Given the pace at which technology advances, there always seems to be a learning curve. With the abundance of consumer electronics available, there typically is no right or wrong way to use these...
Understanding Surface Quality: A Practical GuideUnderstanding Surface Quality: A Practical Guide
John C. Smith, Rocky Mountain Instrument Co. (RMI)
Surface quality has become one of the most poorly understood specifications in the optics industry. A significant portion of the confusion stems from the two major competing (and largely...
Integrating Spheres: Collecting and Uniformly Distributing LightIntegrating Spheres: Collecting and Uniformly Distributing Light
Greg McKee, Labsphere Inc.
An integrating sphere’s function is to spatially integrate radiant flux (light). However, before one can optimize a sphere design for a particular application, it is important to understand how...
Photometry: The Answer to How Light Is PerceivedPhotometry: The Answer to How Light Is Perceived
Photo Research, Inc.
That portion of the spectrum that the eye can see — and its rainbow of colors — is rather small, covering approximately 360 to 830 nm. What colors we perceive depends on wavelength, while...
Radiometry: A Simplified Description of Light MeasurementRadiometry: A Simplified Description of Light Measurement
Angelo V. Arecchi, Labsphere, Inc.
Radiometry involves several activities. The two most common are the description and measurement of optical radiation, and, starting with the knowledge of some aspects of optical radiation at one...
Quantifying Light: Intensity, Uniformity Hold the KeyQuantifying Light: Intensity, Uniformity Hold the Key
Steven Giamundo, Fiberoptics Technology, Inc.
Intensity and uniformity can be described using different physical attributes, which makes interpreting requirements somewhat confusing. This article intends to provide an explanation and serve as a...
Dynamic Interferometry: Getting Rid of the JittersDynamic Interferometry: Getting Rid of the Jitters
John Hayes and James Millerd, 4D Technology Corporation
Conditions on the factory floor and in industrial cleanrooms with high-capacity air filtration systems can hamper the use of interferometry. Another problem is the testing of large-aperture mirrors...
NSOM: Discovering New WorldsNSOM: Discovering New Worlds
M. Kovar, Midako A. Nohe, N.O. Petersen and P.R. Norton, University of Western Ontario
NSOM is suitable for studies on the mesoscopic scale (several tens to hundreds of molecular dimensions). It has become an important tool in research and applications of semiconductors, organic layers...
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