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Atomic Force Microscopes
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(17 companies)
Atomic Force Microscopes
An atomic-force microscope is a type of microscope that produces a quantitative, three-dimensional image of the surface of a sample. The surface is scanned by an extremely sharp tip mounted to a flexible cantilever. The atoms on the tip interact with the atoms on the surface of the sample, causing a deflection of the cantilever; this deflection is monitored and used to generate the image.
Accurion GmbH - Goettingen, Germany
Accurion Inc. - Linthicum Heights, MD
Advanced Surface Microscopy, Inc. - Indianapolis, IN
Agilent Technologies - Chandler, AZ
AIST-NT Inc. - Novato, CA
Anasys Instruments Corp. - Santa Barbara, CA
Asylum Research - Santa Barbara, CA
Bruker, Nano Surfaces Div. - Tucson, AZ
JPK Instruments AG - Berlin, Germany
L.O.T.-Oriel Laser Optics Technology GmbH - Darmstadt, Germany
Laseroptics SA - Buenos Aires, Argentina
NanoMagnetics Instruments Ltd. - Oxford, England
Nanonics Imaging Ltd. - Jerusalem, Israel
Nanosurf AG - Liestal, Switzerland
Novascan Technologies, Inc. - Ames, IA
SciTech Pty Ltd. - Preston, Australia
WITec GmbH - Ulm, Germany
TERMS
atomic force microscope (AFM)
A type of microscope that produces a quantitative, three-dimensional image of the surface of a sample. The surface is scanned by an extremely sharp tip mounted to a flexible cantilever. The atoms on the tip interact with the atoms on the surface of...
TAGS
AFM
three-dimensional image
3-D image
3D image
flexible cantilever
deflection
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