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Applied Precision Inc.

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Applied Precision Inc. of Issaquah, Wash., is set to integrate enhanced total internal reflection fluorescence (TIRF) microscopy into its product line now that is has licensed new technology patents from Yale University in New Haven, Conn. The technology, dubbed “ring-TIRF microscopy” because it illuminates samples with TIRF as an adjustable ring of light, represents a significant improvement over conventional TIRF. Ring-TIRF microscopy removes interference fringes and allows fast multiangle illumination to correct for chromatic differences, for 3-D illumination of the cell cortex and for fast photoactivation. Applied Precision is integrating the new technology into its DeltaVision OMX V4 superresolution microscope systems and expects to launch the product early this year.
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Published: February 2012
Glossary
superresolution
Superresolution refers to the enhancement or improvement of the spatial resolution beyond the conventional limits imposed by the diffraction of light. In the context of imaging, it is a set of techniques and algorithms that aim to achieve higher resolution images than what is traditionally possible using standard imaging systems. In conventional optical microscopy, the resolution is limited by the diffraction of light, a phenomenon described by Ernst Abbe's diffraction limit. This limit sets a...
total internal reflection fluorescence
Total internal reflection fluorescence (TIRF) microscopy is an advanced fluorescence microscopy technique that leverages the principle of total internal reflection to selectively illuminate and image a thin section of a specimen near the interface of two media, typically a glass coverslip and the sample medium. TIRF microscopy allows for high-resolution imaging of fluorescently labeled structures near the cell membrane or other interfaces, offering improved signal-to-noise ratios and reduced...
AmericasApplied PrecisionBiophotonicsBusinesscell biologyConnecticutDeltaVisionDerek ToomreGE HealthcareImagingMicroscopyOMX V4patent licensingPaul GoodwinRapidScanring-TIRF microscopyRobert Roordasuperresolutionsuperresolution microscopeTIRF microscopytotal internal reflection fluorescenceVladimir PolejaevWashingtonYale UniversityYale University School of Medicine

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