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Sales, Acquisition Help Cut Losses for CyberOptics

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MINNEAPOLIS, Aug. 1, 2014 — CyberOptics Corp. reported a net loss of $315,000, down from the loss of $1.2 million in the second quarter of 2013.

Revenues increased 42 percent to $13.3 million from $9.3 million in the second quarter of 2013. Laser Design Inc., a 3-D metrology firm that CyberOptics acquired in March, contributed $1.7 million to the second quarter 2014 revenues.

CEO Dr. Subodh Kulkarni cited strong sales of the company’s LaserAlign sensors for OEMs, WaferSense semiconductors, and new solder paste and automated optical inspection (AOI) systems.

Meanwhile, the company is developing multireflection suppression (MRS) 3-D technology that it said will be part of its next-generation AOIs for smartphone and tablet manufacturing. The company expects to begin marketing MRS in the fourth quarter.

For more information, visit www.cyberoptics.com.
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Published: August 2014
Glossary
automated optical inspection
Automated optical inspection (AOI) is a technology used in manufacturing processes, particularly in electronics, to automatically inspect and detect defects or anomalies in products. AOI systems use optical methods, such as cameras and lighting, to examine components, assemblies, or printed circuit boards (PCBs) for various types of flaws, including missing components, misalignments, soldering defects, and other quality issues. Key components and features of AOI systems typically include: ...
metrology
Metrology is the science and practice of measurement. It encompasses the theoretical and practical aspects of measurement, including the development of measurement standards, techniques, and instruments, as well as the application of measurement principles in various fields. The primary objectives of metrology are to ensure accuracy, reliability, and consistency in measurements and to establish traceability to recognized standards. Metrology plays a crucial role in science, industry,...
3-D3DAmericasautomated optical inspectionBusinessCyberOpticsindustrialLaser DesignmetrologyMRSSubodh KulkarniWaferSenseLaserAlignmultireflection suppression

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