SANTA BARBARA, Calif., Aug. 15, 2012 — Bruker Corp. has released a modular photoconductive atomic force microscope (AFM) that transforms its Dimension Icon platform into a system for dedicated nanoscale organic photoelectric materials research. The new accessory enables sample illumination while performing nanoscale electrical characterization.
In conjunction with proprietary PeakForce TUNA technology, it enables high-resolution photoconductivity and correlated nanomechanical mapping for research on fragile OLED and organic photovoltaic device samples. It is compatible with the company’s turnkey 1-ppm glove box configuration, addressing the stringent environmental control needs of organic photoelectric materials.
The new module builds on proprietary PeakForce Tapping technology to provide high-resolution data to advance organic photoelectric materials research. It provides uniform back-side sample illumination and can be fiber-coupled to industry-standard solar simulators.
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