Anasys Instruments Corp.
has launched the afm+, a fully integrated atomic force microscopy (AFM) platform for research and analysis. Using thermal probe technology for nanoscale thermal analysis (nano-TA), the afm+ allows the user to obtain transition temperatures on any local feature of a sample or to obtain a transition temperature map. It facilitates measurement of glass transition and melting temperatures. This mode also includes scanning thermal microscopy, which allows the user to map relative thermal conductivity and temperature differences across the sample. Transition temperature microscopy is used to quantify and map thermal transitions in heterogeneous materials. It is a fully automated mode in which an array of nano-TA measurements is rapidly performed and each temperature ramp analyzed to determine the transition temperature.
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