BOULDER, Colo., Aug. 5, 2008 -- Precision Photonics Corp., provider of ultraprecise optics and optomechanical assemblies, has developed advanced polishing, testing and coating techniques for optical-grade silicon material.
By using metrology, wafer-based optical fabrication and Precision Photonics’ advanced ion-beam-sputtering (IBS) coatings, this technique is able to produce ultraflat components repeatedly and in large quantities, the company said.
Thickness measurements taken with our laser-based, NIST-traceable SW1500 metrology system confirm total thickness variations (TTV) less than 15 nm across a 50 mm diameter -- a parallelism of less than .1 arcseconds.
Solid silicon etalons are often used as tunable dispersion compensators and as optical frequency discriminators. Designers can achieve rapid tuning and uniform heat distribution by controlling the transmission properties of the etalon through refractive index modulation. Custom etalons, filters and wafers are available coated or uncoated with surface quality as low as 20/10 in sizes from 1.5 x 1.5 mm 2 to 100 mm diameter.
For more information, visit: www.precisionphotonics.com
Precision Photonics Corp.
3180 Sterling Circle
Boulder, Colo., 80301
Phone: (303) 444-9948
Fax: (303) 444-9951
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